Ibrayeva A, O'Connell J, van Vuuren AJ, Skuratov V. Annealing Of Irradiation Defects In Si3n4: Tem Examination. Eur. J. Phys. Funct. Mater. 2026;9(1). Accessed March 10, 2026. https://ephys.kz/index.php/journal/article/view/43