RYMZHANOV, R. MD and TEM evaluation of swift Xe ion induced latent tracks in Si3N4. Eurasian Journal of Physics and Functional Materials, [S. l.], v. 3, n. 4, 2026. Disponível em: https://ephys.kz/index.php/journal/article/view/144. Acesso em: 5 mar. 2026.