SHLIMAS, D; KOZLOVSKIY, A. L.; KALIEKPEROV, M. E.; KADYRZHANOV, K. K.; UGLOV, V. V. Study of the strength characteristics and radiation resistance of thin-film coatings based on CuX (X=Bi, Mg, Ni). Eurasian Journal of Physics and Functional Materials, [S. l.], v. 4, n. 3, 2026. Disponível em: https://ephys.kz/index.php/journal/article/view/169. Acesso em: 10 mar. 2026.