Rymzhanov, R, A. Zhalmagambetova, A. Ibrayeva, A. Janse van Vuuren, J.H. O’Connell, and V.A. Skuratov. “MD and TEM Evaluation of Swift Xe Ion Induced Latent Tracks in Si3N4”. Eurasian Journal of Physics and Functional Materials 3, no. 4 (March 3, 2026). Accessed May 10, 2026. https://ephys.kz/index.php/journal/article/view/144.