RAMANNA, Madhusudhana; PUTTASWAMY, Roopadevi; PUTTEGOWDA, Ramya; SHIVAKUMAR, Sachin; LINGANNA, Vinaykumar; RAVIKIRAN; BANDADKA, Sachin; HALLIGUDRA, Guddappa. Study of the Hole Behavior Properties of ITO/ZnO/VOPc/MoO3 /Al Devices by Varying the Temperature and Thickness via Impedance Spectroscopy. Eurasian Journal of Physics and Functional Materials, [S. l.], v. 9, n. 4, 2026. Disponível em: https://ephys.kz/index.php/journal/article/view/18. Acesso em: 11 mar. 2026.